MapX – Wafer Map Visualization & Yield Analysis Platform

Semiconductor wafer map visualization and yield analysis platform. Native support for industry-standard formats with no third-party converters needed.

Supported Formats

SEMI E142 – Modern XML-based wafer map exchange standard by SEMI
KLARF – KLA inspection and defect review data format
SINF – Widely adopted text-based wafer map format
TEL GMS – Tokyo Electron prober and handler format
TFF – KLA-Tencor/TOPCON inspection format
XYBin – Lightweight coordinate-based wafer map format

Key Features

2D and 3D interactive wafer map visualization
Multi-map side-by-side comparison
GDBN (Good Die in Bad Neighborhood) spatial screening
Automated failure cluster detection
Spatial pattern analysis (zone, radial, sector)
Bin migration tracking
Interactive die bin editing with undo/redo
Compatible with Siemens Opcenter and Camstar MES

Free Tools

Die Per Wafer (DPW) Calculator – Estimate die count for any wafer size
Wafer Yield Calculator – Estimate die yield using Poisson, Murphy, and Seeds models
Wafer Map Format Guide – Learn about semiconductor wafer map formats

Contact: hi.mapx@gmail.com