SEMI
The modern industry standard for wafer map data exchange.
Format reference
Native support for industry-standard semiconductor wafer map formats. No third-party converters needed.
SEMI
The modern industry standard for wafer map data exchange.
Wafer inspection systems
Industry-standard format for wafer inspection and defect data.
Industry Standard
Widely adopted text-based wafer map format with broad legacy support.
Prober and handler equipment
Native format for prober and handler equipment.
Wafer inspection systems
Binary inspection format from automated wafer inspection systems.
Generic
Lightweight coordinate-based wafer map format for data exchange.
ATE industry standard
The binary datalog every wafer sort tester writes.
MAPx handles all of these formats natively
No converters needed. Upload your own files and analyze them in the free trial.