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Wafer yield calculator
Estimate semiconductor die yield using industry-standard models. Enter defect density and die area, then calculate.
Die parameters
mm²
dies
Defect density
/cm²
Cost (optional)
$
Yield
—
Good dies
—
Cost / die
—
Die area
50
mm²
How it works
Yield models estimate the probability that a die is defect-free based on die area (A) and defect density (D₀). The Poisson model assumes random defects (Y = e⁻ᴬᴰ). Murphy's model accounts for clustering (Y = ((1-e⁻ᴬᴰ)/AD)²). Seeds' model is more conservative (Y = 1/(1+AD)). All models use die area in cm² and defect density in defects/cm².
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MAPx provides spatial analysis, GDBN screening, and yield trending from actual wafer maps. Try it free with your own files.