1 · Request access
Enter your work email, name and company on the trial page.
Back to MAPx
Free trial
Try MAPx on your own wafer maps
Upload up to 5 real map files and explore the viewer, yield and spatial analysis MAPx runs on the fab floor. No password, no credit card, nothing to install.
What you get
- Interactive 2D wafer map with bin colours, die hover and zoom
- 3D fail-density view of the same wafer
- Bin definitions and yield per map
- Zone analysis — radial and sector yield
- Stack analysis across two or more maps of the same wafer
- Automatic defect-pattern (spatial signature) classification
Formats accepted
E142KLARFSINFSTDFTEL GMSTEL 1E6XYBinTFF
Files are recognised by content, not extension — drop the file the prober, tester or inspection tool actually wrote. Companion files (TEL) upload together. See the format guide for what each one carries.
How sign-in works
2 · Enter the code
We email a 6-digit code. It works once and expires in 10 minutes. No password to invent.
3 · Upload and explore
Drop your maps, open the viewer, run the analyses. You stay signed in on that browser for 30 days.
What the trial is not
The trial is a hosted demo of the viewer and the core analyses. The MAPx product runs on your own servers, connected to your MES, with format write-back, analysis recipes, GDBN and cluster detection, reticle analysis, bin migration tracking and excursion monitoring across lots — none of which fit in a five-file demo. When you have seen your maps render, email us for a pilot.
Files you upload to the trial are stored on our server so the viewer can render them and are visible only to your account. Details in the privacy policy.