All formats
Format guide
STDF
The binary datalog every wafer sort tester writes.
BinaryStandard Test Data Format (STDF V4)
What it is
STDF is the semiconductor industry's de-facto ATE output — the binary datalog produced by automated test equipment at wafer sort. A single datalog carries every tested wafer in the lot along with both hard bin and soft bin results, which MAPx extracts into individual wafer maps at ingest.
Why it matters
- De-facto output of automated test equipment at wafer sort
- One datalog fans out to every wafer it contains
- Carries both hard bin and soft bin for each die
- Streamed at ingest, so gigabyte datalogs never load whole
- Per-die parametric data available on demand